A new approach for extracting phase effect based on in-line X-ray phase imaging
Crossref DOI link: https://doi.org/10.1007/s10043-014-0043-8
Published Online: 2014-06-06
Published Print: 2014-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xia, Tian
Ma, Junshan
Zhang, Xuelong
Cheng, Jinghai
Peng, Weijun
Yao, Xufeng
Text and Data Mining valid from 2014-05-01