Phase-shifting interferometric profilometry with a wavelength-tunable diode source
Crossref DOI link: https://doi.org/10.1007/s10043-014-0064-3
Published Online: 2014-06-06
Published Print: 2014-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Takahashi, Takeshi
Ishii, Yukihiro
Onodera, Ribun
Text and Data Mining valid from 2014-05-01