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An automated assessment method for integrated circuit chip detachment from printed circuit board by multistep binarization and template matching of X-ray transmission images

Crossref DOI link: https://doi.org/10.1007/s10163-020-01131-1

Published Online: 2020-11-03

Published Print: 2021-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Ueda, Takao http://orcid.org/0000-0002-6206-2085
Oki, Tatsuya

Koyanaka, Shigeki
Funding

Funding for this research was provided by:

New Energy and Industrial Technology Development Organization (P17001)
License Information

Text and Data Mining valid from 2020-11-03

Version of Record valid from 2020-11-03
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Article History

Received: 26 April 2020

Accepted: 19 October 2020

First Online: 3 November 2020

Change Date: 5 December 2020

Change Type: Correction

Change Details: The article “An automated assessment method for integrated circuit chip detachment from printed circuit board.

Updates are available Correction dated 2020-12-05

Click to view Correction: https://doi.org/10.1007/s10163-020-01144-w