Estimation and compensation of process-induced variations in capacitors for improved reliability in integrated circuits
Crossref DOI link: https://doi.org/10.1007/s10470-014-0390-1
Published Online: 2014-08-14
Published Print: 2014-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Milosavljević, Ivan M.
Grujić, Dušan N.
Simić, Đorđe Č.
Popović-Božović, Jelena S.
Text and Data Mining valid from 2014-08-14