Making use of semiconductor manufacturing process variations: FinFET-based physical unclonable functions for efficient security integration in the IoT
Crossref DOI link: https://doi.org/10.1007/s10470-017-1053-9
Published Online: 2017-10-07
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yanambaka, Venkata P.
Mohanty, Saraju P. http://orcid.org/0000-0003-2959-6541
Kougianos, Elias
License valid from 2017-10-07