A novel method for minimizing transient current test time by exploiting RES in SRAM
Crossref DOI link: https://doi.org/10.1007/s10470-020-01747-1
Published Online: 2020-12-01
Published Print: 2021-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Prince, Princy http://orcid.org/0000-0003-0978-5767
Sivamangai, N. M.
Text and Data Mining valid from 2020-12-01
Version of Record valid from 2020-12-01
Article History
Received: 6 May 2020
Revised: 23 August 2020
Accepted: 3 November 2020
First Online: 1 December 2020