An improved low transition test pattern generator for low power applications
Crossref DOI link: https://doi.org/10.1007/s10617-017-9188-6
Published Online: 2017-09-27
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vellingiri, Govindaraj
Jayabalan, Ramesh
License valid from 2017-09-27