Genetic Algorithm-based Test Generation for Software Product Line with the Integration of Fault Localization Techniques
Crossref DOI link: https://doi.org/10.1007/s10664-016-9494-9
Published Online: 2017-02-05
Published Print: 2018-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Xuelin
Wong, W. Eric http://orcid.org/0000-0002-1021-4753
Gao, Ruizhi
Hu, Linghuan
Hosono, Shigeru
License valid from 2017-02-05