Photocarrier Radiometry Investigation of Light-Induced Degradation of Boron-Doped Czochralski-Grown Silicon Without Surface Passivation
Crossref DOI link: https://doi.org/10.1007/s10765-016-2049-x
Published Online: 2016-02-20
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Qian
Li, Bincheng
Funding for this research was provided by:
National Natural Science Foundation of China (CN) (61076090)
Text and Data Mining valid from 2016-02-20