Material contrast studies of conductive thin films on semiconductor substrates using scanning electrochemical microscopy
Crossref DOI link: https://doi.org/10.1007/s10800-019-01294-2
Published Online: 2019-02-22
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hanekamp, Patrick
Raith, Timo
Iffelsberger, Christian
Zankl, Tobias
Robl, Werner
Matysik, Frank-Michael
Text and Data Mining valid from 2019-02-22
Article History
Received: 28 September 2018
Accepted: 11 February 2019
First Online: 22 February 2019