Taking into Account Interelement Interference in X-Ray Fluorescence Analysis of Thin Two-Layer Ti/V Systems
Crossref DOI link: https://doi.org/10.1007/s10812-018-0617-5
Published Online: 2018-04-03
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mashin, N. I.
Razuvaev, A. G.
Cherniaeva, E. A.
Gafarova, L. M.
Ershov, A.V.
Text and Data Mining valid from 2018-03-01
Article History
Received: 26 April 2017
First Online: 3 April 2018