Optically Detected Magnetic Resonance Spectroscopy in Silicon Carbide using Temperature Sweep
Crossref DOI link: https://doi.org/10.1007/s10812-020-00956-w
Published Online: 2020-03-26
Published Print: 2020-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Breev, I. D.
Anisimov, A. N.
Babunts, R. A.
Baranov, P. G.
Text and Data Mining valid from 2020-03-01
Version of Record valid from 2020-03-01
Article History
Received: 30 July 2019
First Online: 26 March 2020