Comprehensive analysis of GR noise in InGaP–GaAs HBT by physics-based simulation and low frequency characterization
Crossref DOI link: https://doi.org/10.1007/s10825-014-0639-z
Published Online: 2014-11-07
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nallatamby, Jean-Christophe
Laurent, Sylvain
Prigent, Michel
Jacquet, Jean-Claude
Floriot, Didier
Delage, Sylvain
Text and Data Mining valid from 2014-11-07