Hybrid methodology to model random dopant fluctuations in low doped FinFETs
Crossref DOI link: https://doi.org/10.1007/s10825-015-0684-2
Published Online: 2015-03-07
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Agarwal, Samarth
Johnson, Jeffrey B.
Bajaj, Mohit
Furkay, Stephen S.
Oldiges, Philip J.
Robison, Robert R.
Murali, K. V. R. M.
Text and Data Mining valid from 2015-03-07