Model for threshold voltage instability in top-gated nanocrystalline silicon thin film transistor
Crossref DOI link: https://doi.org/10.1007/s10825-015-0789-7
Published Online: 2016-01-06
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sharma, Prachi
Gupta, Navneet
Text and Data Mining valid from 2016-01-06