Impact of contact resistance on memory window in phase-change random access memory (PCRAM)
Crossref DOI link: https://doi.org/10.1007/s10825-016-0905-3
Published Online: 2016-10-21
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
An, Jun-seop
Choi, Chul-min
Shindo, Satoshi
Sutou, Yuji
Kwon, Yong-woo
Song, Yun-heub
License valid from 2016-10-21