General considerations and implications of isolated oxygen vacancies in oxide-based filamentary ReRAM devices
Crossref DOI link: https://doi.org/10.1007/s10825-017-1046-z
Published Online: 2017-08-24
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wicklein, Sebastian
License valid from 2017-08-24