Multiscale modeling of oxide RRAM devices for memory applications: from material properties to device performance
Crossref DOI link: https://doi.org/10.1007/s10825-017-1095-3
Published Online: 2017-10-25
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Larcher, Luca
Padovani, Andrea http://orcid.org/0000-0003-1145-5257
License valid from 2017-10-25