Circuit-level simulation of resistive-switching random-access memory cross-point array based on a highly reliable compact model
Crossref DOI link: https://doi.org/10.1007/s10825-017-1116-2
Published Online: 2017-12-07
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Min-Hwi http://orcid.org/0000-0003-1135-769X
Kim, Sungjun
Ryoo, Kyung-Chang
Cho, Seongjae
Park, Byung-Gook
Funding for this research was provided by:
National Research Foundation of Korea (2015R1A2A1A01007307)
License valid from 2017-12-07