A nonlinear model to assess DC/AC performance reliability of submicron SiC MESFETs
Crossref DOI link: https://doi.org/10.1007/s10825-018-1165-1
Published Online: 2018-04-10
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rehman, S.
Ahmed, M. M.
Rafique, U.
Khan, M. N.
Text and Data Mining valid from 2018-04-10
Article History
First Online: 10 April 2018