HSPICE model and circuit simulation for a single-event effect caused by ions at different incident positions
Crossref DOI link: https://doi.org/10.1007/s10825-018-1201-1
Published Online: 2018-06-15
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yi, Tengyue http://orcid.org/0000-0002-1848-0212
Liu, Yi
Wu, Zhenyu
Shen, Chen
Yang, Yintang
Funding for this research was provided by:
Equipment Pre-research Project of China (41424050607)
Text and Data Mining valid from 2018-06-15
Article History
First Online: 15 June 2018