An analysis of interface trap charges to improve the reliability of a charge-plasma-based nanotube tunnel FET
Crossref DOI link: https://doi.org/10.1007/s10825-021-01696-6
Published Online: 2021-04-08
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gedam, Anju
Acharya, Bibhudendra
Mishra, Guru Prasad http://orcid.org/0000-0003-0326-7619
Text and Data Mining valid from 2021-04-08
Version of Record valid from 2021-04-08
Article History
Received: 22 September 2020
Accepted: 20 March 2021
First Online: 8 April 2021