Crossmark

A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors

Crossref DOI link: https://doi.org/10.1007/s10832-016-0032-3

Published Online: 2016-04-08

Published Print: 2016-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Park, Jozeph

Trung, Nguyen Dinh

Kim, Yang Soo

Kim, Jong Heon

Park, Kyung

Kim, Hyun-Suk
Funding

Funding for this research was provided by:

National Research Foundation of Korea (2014R1A1A2055138)

Chungnam National University
License Information

Text and Data Mining valid from 2016-04-08