High dielectric temperature stability and dielectric relaxation mechanism of (K0.5Na0.5)NbO3-LaBiO3 ceramics
Crossref DOI link: https://doi.org/10.1007/s10832-021-00245-8
Published Online: 2021-06-17
Published Print: 2021-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhou, Shuo
Yan, Tianxiang http://orcid.org/0000-0002-2170-9372
Chen, Kaiyuan
Wang, Jie
Qiang, Yu
He, Xiafeng
Fang, Liang
Liu, Laijun
Text and Data Mining valid from 2021-04-01
Version of Record valid from 2021-04-01
Article History
Received: 5 September 2020
Accepted: 10 June 2021
First Online: 17 June 2021