Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique
Crossref DOI link: https://doi.org/10.1007/s10836-014-5453-9
Published Online: 2014-05-22
Published Print: 2014-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Arvaniti, Efi
Tsiatouhas, Yiorgos
Text and Data Mining valid from 2014-05-22