A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients
Crossref DOI link: https://doi.org/10.1007/s10836-014-5476-2
Published Online: 2014-09-23
Published Print: 2014-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pahlevanzadeh, Hoda
Yu, Qiaoyan
Text and Data Mining valid from 2014-09-23