A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs
Crossref DOI link: https://doi.org/10.1007/s10836-015-5517-5
Published Online: 2015-03-27
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Huang, Ryan H.-M.
Hsu, Dennis K.-H.
Wen, Charles H.-P.
Text and Data Mining valid from 2015-03-27