Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors
Crossref DOI link: https://doi.org/10.1007/s10836-015-5534-4
Published Online: 2015-08-25
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dimakos, Athanasios
Stratigopoulos, Haralampos-G.
Siligaris, Alexandre
Mir, Salvador
Foucauld, Emeric De
Text and Data Mining valid from 2015-08-01