Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell
Crossref DOI link: https://doi.org/10.1007/s10836-015-5537-1
Published Online: 2015-08-26
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Simionovski, Alexandre
Vaz, Rafael G.
Gonçalez, Odair L.
Wirth, Gilson
Text and Data Mining valid from 2015-08-01