Defect Level Constrained Optimization of Analog and Radio Frequency Specification Tests
Crossref DOI link: https://doi.org/10.1007/s10836-015-5545-1
Published Online: 2015-11-07
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sindia, Suraj
Agrawal, Vishwani D.
Funding for this research was provided by:
National Science Foundation (CNS-0708962, CCF-1116213, IIP-0738088)
Text and Data Mining valid from 2015-11-07
Version of Record valid from 2015-11-07
Article History
Received: 1 June 2015
Accepted: 22 October 2015
First Online: 7 November 2015