Double Node Upsets Hardened Latch Circuits
Crossref DOI link: https://doi.org/10.1007/s10836-015-5551-3
Published Online: 2015-11-17
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Yuanqing
Wang, Haibin
Yao, Suying
Yan, Xi
Gao, Zhiyuan
Xu, Jiangtao
Funding for this research was provided by:
National Natural Science Foundation of China (61504038)
Text and Data Mining valid from 2015-11-17