A Built-in Single Event Upsets Detector for Sequential Cells
Crossref DOI link: https://doi.org/10.1007/s10836-015-5560-2
Published Online: 2015-12-22
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Yuanqing
Wang, Haibin
Li, Lixiang
Chen, Li
Liu, Rui
Chen, Mo
Text and Data Mining valid from 2015-12-22