Test Scheduling for Network-on-Chip Using XY-Direction Connected Subgraph Partition and Multiple Test Clocks
Crossref DOI link: https://doi.org/10.1007/s10836-016-5565-5
Published Online: 2016-01-20
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hu, Cong
Li, Zhi
Xu, Chuanpei
Jia, Mengyi
Text and Data Mining valid from 2016-01-20