An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits
Crossref DOI link: https://doi.org/10.1007/s10836-016-5574-4
Published Online: 2016-03-16
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nagamani, A. N.
Ashwin, S.
Abhishek, B.
Agrawal, V. K.
Text and Data Mining valid from 2016-03-16