Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing
Crossref DOI link: https://doi.org/10.1007/s10836-016-5582-4
Published Online: 2016-04-02
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ishida, Masahiro
Nakura, Toru
Kusaka, Takashi
Komatsu, Satoshi
Asada, Kunihiro
Text and Data Mining valid from 2016-04-02