The Faults Diagnostic Analysis for Analog Circuit Based on FA-TM-ELM
Crossref DOI link: https://doi.org/10.1007/s10836-016-5597-x
Published Online: 2016-06-22
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, WenXin
Sui, Yongbo
Wang, Junnian
License valid from 2016-06-22