Current-Based Testing, Modeling and Monitoring for Operational Deterioration of a Memristor-Based LUT
Crossref DOI link: https://doi.org/10.1007/s10836-016-5611-3
Published Online: 2016-08-31
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kumar, T. Nandha
Almurib, Haider A. F.
Lombardi, Fabrizio
License valid from 2016-08-31