ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling
Crossref DOI link: https://doi.org/10.1007/s10836-017-5642-4
Published Online: 2017-01-26
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhuang, Yuming http://orcid.org/0000-0001-7744-5268
Chen, Degang
Funding for this research was provided by:
Semiconductor Research Corporation (1836.127)
License valid from 2017-01-26