A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip
Crossref DOI link: https://doi.org/10.1007/s10836-017-5666-9
Published Online: 2017-06-05
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Aghaei, Babak http://orcid.org/0000-0002-2209-9967
Khademzadeh, Ahmad
Reshadi, Midia
Badie, Kambiz
License valid from 2017-06-05