A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm
Crossref DOI link: https://doi.org/10.1007/s10836-017-5696-3
Published Online: 2017-12-20
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Duan, Yan
Chen, Tao
Chen, Degang
License valid from 2017-12-01