Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design
Crossref DOI link: https://doi.org/10.1007/s10836-018-5703-3
Published Online: 2018-02-01
Published Print: 2018-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shah, Toral http://orcid.org/0000-0003-4037-2418
Matrosova, Anzhela
Fujita, Masahiro
Singh, Virendra
Text and Data Mining valid from 2018-02-01
Article History
Received: 31 July 2017
Accepted: 2 January 2018
First Online: 1 February 2018