A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits
Crossref DOI link: https://doi.org/10.1007/s10836-018-5713-1
Published Online: 2018-02-19
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shi, Congyin
Lee, Sanghoon http://orcid.org/0000-0002-9927-3038
Aguilar, Sergio Soto
Sánchez-Sinencio, Edgar
Text and Data Mining valid from 2018-02-19
Article History
Received: 14 November 2017
Accepted: 6 February 2018
First Online: 19 February 2018