Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects
Crossref DOI link: https://doi.org/10.1007/s10836-019-05784-1
Published Online: 2019-03-26
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Medeiros, G. Cardoso
Brum, E.
Poehls, L. Bolzani
Copetti, T.
Balen, T.
Text and Data Mining valid from 2019-03-26
Article History
Received: 11 October 2018
Accepted: 1 March 2019
First Online: 26 March 2019