Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition
Crossref DOI link: https://doi.org/10.1007/s10836-019-05842-8
Published Online: 2020-01-20
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Moon, Thomas http://orcid.org/0000-0001-8256-1183
Choi, Hyun Woo
Keezer, David C.
Chatterjee, Abhijit
Text and Data Mining valid from 2019-12-01
Version of Record valid from 2019-12-01
Article History
Received: 26 April 2019
Accepted: 26 November 2019
First Online: 20 January 2020