An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits
Crossref DOI link: https://doi.org/10.1007/s10836-020-05855-8
Published Online: 2020-02-04
Published Print: 2020-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Handique, Mousum
Deka, Jantindra Kumar
Biswas, Santosh http://orcid.org/0000-0003-3020-4154
Text and Data Mining valid from 2020-02-01
Version of Record valid from 2020-02-01
Article History
Received: 28 July 2019
Accepted: 12 January 2020
First Online: 4 February 2020