Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects
Crossref DOI link: https://doi.org/10.1007/s10836-020-05869-2
Published Online: 2020-05-23
Published Print: 2020-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Copetti, T.
Balen, T. R.
Brum, E.
Aquistapace, C.
Bolzani Poehls, L.
Text and Data Mining valid from 2020-04-01
Version of Record valid from 2020-04-01
Article History
Received: 8 November 2019
Accepted: 2 March 2020
First Online: 23 May 2020