Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations
Crossref DOI link: https://doi.org/10.1007/s10836-023-06068-5
Published Online: 2023-05-25
Published Print: 2023-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
CouliƩ, K. http://orcid.org/0000-0001-6966-4604
Aziza, H.
Rahajandraibe, W.
Text and Data Mining valid from 2023-05-25
Version of Record valid from 2023-05-25
Article History
Received: 25 June 2022
Accepted: 9 May 2023
First Online: 25 May 2023
Declarations
:
: The authors have no relevant financial or non-financial interests to disclose.