Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing
Crossref DOI link: https://doi.org/10.1007/s10845-014-0956-x
Published Online: 2014-08-26
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sahnoun, M’hammed
Bettayeb, Belgacem
Bassetto, Samuel-Jean
Tollenaere, Michel
Text and Data Mining valid from 2014-08-26