Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips
Crossref DOI link: https://doi.org/10.1007/s10845-016-1275-1
Published Online: 2016-11-08
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kuo, Chung-Feng Jeffrey
Tung, Chun-Ping
Weng, Wei-Han
Text and Data Mining valid from 2016-11-08
Article History
Received: 7 July 2016
Accepted: 26 October 2016
First Online: 8 November 2016