Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels
Crossref DOI link: https://doi.org/10.1007/s10845-020-01571-4
Published Online: 2020-04-16
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Seyoung
Jang, Jaeyeon
Kim, Chang Ouk http://orcid.org/0000-0002-6936-5409
Funding for this research was provided by:
National Research Foundation of Korea (NRF-2019R1A2B5B01070358)
Text and Data Mining valid from 2020-04-16
Version of Record valid from 2020-04-16
Article History
Received: 2 January 2020
Accepted: 31 March 2020
First Online: 16 April 2020